1. The article discusses the increasing relevance of soft errors in semiconductor devices due to advanced processes and reliability-critical applications. 2. It highlights how IROC, with its tool TFIT, helps in analyzing and mitigating soft errors in various circuits, making them safer for use in critical applications like autonomous vehicles and medical devices. 3. The TFIT tool simplifies the process of soft error analysis, making it accessible to design teams and enhancing the safety and reliability of semiconductor devices.